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Eureka 對記憶模組進行快速的功能動態(tài)測試，并采用多個先進的檢查模式來檢測出短/斷路**、單一顆粒**、記憶胞間的絕緣**、時序及雜訊問題引起的間歇性**…等記憶體測試設(shè)備 Eureka
加裝選購的漏電流測試轉(zhuǎn)接模組后，即可進行半導體漏電流特性的測試，并能檢出DRAM晶片的微小漏電流。
Eureka 具有內(nèi)建的SPD(serial presence detect)燒錄器可用來燒錄及驗證測試SPD內(nèi)容，可在記憶體模組測試時隨同進行。
Eureka加入了許多加強功能來提升測試的正確性，像晶片預熱chip-heating，電源電壓變動模擬voltage bouncing，循環(huán)(回路)測試loop test，
可調(diào)式時基adjustable timing parameters (selected)，可調(diào)整式更新模式及周期alterable refresh mode and cycle，更新測試refresh test，
ICC電流測定，也有Address與RAS/CAS測試，不論有/無緩沖級的模組，Eureka都能支援同位與ECC 位元檢查，
另外，Eureka也能配合CST*新的RoboFlex自動取置機 來進行全自動測試，其效能表現(xiàn)更是如虎添翼，此外，可額外選購加裝的測試配備有Flash testing，
Cache testing，DRAM & SDRAM TSOP Chips testing

規(guī)格

DDR testing platform

Clock Frequency

200 Mhz & 266 Mhz selectable

Address Depth

4 Gigawords test capacity up to 16 row x 16 column

Data Width

Expandable up to 80 bits

Timing Range

-1 , 0 and 1 ns

Timing Resolution

1 ns

Vdd Range

0.1V to 2.7V with 0.1V step and 10%Bounce

Vih, Voref Range

0.1V to 2.7V with 0.1V step

Read Latency

2,3 clocks

Refresh Cycle

Auto/Self Refresh - 8祍/Row

Refresh Modes

Auto Refresh , Self Refresh

Leakage Test Option

+/- 1礎(chǔ) to +/- 5mA

Test Features

Burst Mode, Programmable Data Mask, Data Strobe, and Clock Suspend Modes

Current Test

Icc Standby, Icc Operating-Avg Icc up to 1.5A, Peak Curent up to 2.0A

Burst Length

Programmable to 2,4,8

CAS Latency

Programmable read Latency From Column Address

Serial PD

256 Bytes programmable

Testing Support Options

DDR 184pin DIMM and 200pin SODIMM

SDRAM testing platform

Clock Frequency

133 mhz 100 mhz, 66mhz, 33mhz selectable

Address Depth

4 Gigawords test capacity up to 16 row x 16 column

Data Width

Expandable up to 160 bits

Timing Range

0ns to 20ns in 1ns resolution

Timing Resolution

in steps of 1ns resolution

Vcc Range

0.1V to 3.6V with 0.1V step and 10 %Bounce

Vih, Voref Range

0.1V to 3.6V with 0.1V step

Read Latency

1,2,3 clocks

Refresh Cycle

Auto/Self Refresh - 8祍/Row to 64祍/Row

Refresh Modes

RAS only, CAS before RAS, Self Refresh

Leakage Test Option

+/- 1礎(chǔ) to +/- 5mA

Test Features

Burst Mode, Programmable Data Mask and Clock Suspend Modes

Current Test

Icc Standby, Icc Operating-Avg Icc up to 1.5A, Peak Curent up to 2.0A

Burst Length

Programmable to 1,2,4,8 or Full Page

CAS Latency

Programmable read Latency From Column Address

Serial PD

256 Bytes programmable

Testing Support Options

SDRAM 100p, 168p, 200p, 244p, 278p DIMM, 144p Sodimm, TSOP, SGRAM 144p and many more

General specifications

Power Requirements

90-130 VAC, 180-260 VAC at 50Hz or 60 Hz

Operating Temperature

-20 to 100 degree Fahrenheit

Humidity

20% to 80%, non condensing

Overcurrent Protection

2A; to prevent Vcc and Ground short problems

Host Computer Requirement (Not Included)

IBM PC or Compatible 386/486/Pentium with one ISA or EISA bus interface slot available for CST, Inc. proprietary interface card

Operating System Requirement (Not Included)

Standard Microsoft Window Windows 95/9